IPS Probe Station Features
KitStart Test Packages Comprehesive solutions for your semiconductors characterizations.
FA Test Package, <5fA current leakge.
BIV Test Package, <10nA current leakge.
COAX Test Package, <10pA current leakge.
TRIAX Test Package, <100fA current leakge.
RF Test Package for S parameter characterizations.
,etc.
Modular design User can start with an simple set up can upgrade the system with our modular
parts.
Microscope module, hot chuck module, coax/triax chuck module etc.
Highly Cost-effective Modular design allow you to choose for the parts that are necessary, saving capital costs.
Unique chuck X-Y Standard chuck air bearing stage for fast X-Y movement.
Screws driven X-Y available upon request.
<5fA Leakage Current, <10fF Residual Capacitance
IPS probe station was designed with the advanced concept for ultra-low noise measurement at the beginning. IPS probe station can easily achieve the goal of <5fA leakage current and <10fF residual capacitance by using proper probes and shielding techniques.
FemtoProbe and CPA-10 Coax Probe extends the guarding area to the edge of the probe tips, greatly reduce the leakage current from probe tips. EMIShield enclosure protects the system from electrostatic and AC filed interference.
Basic I-V/C-V Measurement Set up
KeyFactor’s IPS probe station can be set up with basic measurement functions if you don’t need a high precision probe station at the beginning. Our modular design allow you to upgrade our system with ease(no return and no modification).
For basic I-V/C-V measurement, you can start with our model IPS-AS-Stereo with S10 series probe holders and DTP100/DCP100 micropostioners.
RF S Parameters Measurement Set up
IPS probe station is not only for I-V/C-V measurement. You can also set it up for RF measurement of S parameters.
The basic set up of IPS-RF consists of: 1set of IPS-AS-Stereo probe station(with auxiliary chucks), 2 sets of DCP100 micropositioners, 2 sets of RFH100 probe adapters, 2 sets of M40A RF probes and accessories for up to 40GHz measurement.
The rigid and stable design of DCP10 and RFH100 assures accurate probing and stable contacts of probes to pads, thus improving test reliability.
High Power Measurement Set up
Safety is the first consideration of high power characterizations. Our IPS-HP model is always provided with EMIShield enclosure with interlock or safety light curtain. These configurations will protect user from electric shocking harm.
The test capability of model IPS-HP is for up to 3kV high voltage and 40A high current measurement. In order to avoid arcing at high voltage, IPS-HP is specially designed with an Anti-Arc structure.
Hot Chuck Options
KeyFactors also provides hot chucks for users require thermal test conditions. The most popular set up is RT to 200℃ temperature range with 0.1℃ stability. We can also provide higher temperature range, such as RT to 300℃ or RT to 800℃.
The hot chuck system consists of a gold-plated sample holder and a temperature regulation system – TemPro. With this configuration, you can set and monitor temperature on our TemPro controller or on our TemPro software on computer.
Output power of TemPro is DC 24V that protects you from electric shock harm, keeping you safe. The DC power output also has smaller EMI to your tests than AC power temperature controllers.
Triaxial chuck options
The key to success of ultra-low noise I-V/C-V measurement is to make the probe station “invisible” to the test instrument. That means you will need to be very careful about the guarding, shielding and grounding of the probe station. Any failure of these factors will cause leakage current to surge obviously.
With our triaxial chuck, you can succeed easily in ultra-low noise measurement simply by connecting our probe station from one side to the other.
Customizable to meet your photon-electric charaterizations
KeyFactor can also customized for holders or any structures for photon-electric tests. We can design these structures for your lasers, fibers and other optical parts and make them compatible with our IPS probe station.