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Features of IPS Probe Station

Application oriented – Kitstart test kits for various applications.


Cost-effective – Users can start with a very cost-effective set up.


Modular design – Various modular options allow user to upgrade the system easily. 


Unique X-Y– Air bearing stage for fast movement and micrometer heads for accurate X-Y movement. 

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IPS-BIV KitStart for Basic I-V Measurements.

IPS-BIV is a cost-effective probing solution for basic I-V measurements. This system incorporates everything you need 

for tests and measurements down to nA levels. The modular design of IPS allow you to upgrade your IPS-BIV to a higher 

system for coax, triax, RF, high current or high voltage tests and meausrements by simply replacing parts of this system. 

Your current investment will be protected for your future needs.


Please download <IPS-BIV Flyer.pdf> for detail information.

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IPS-COAX KitStart for Optimized I-V, C-V, Pulsed I-V Measurements.

IPS-COAX is a optimized probing solution for optimized I-V/C-V measurements. This system incorporates everything

you need for tests and measurements down to pA levels. 


Please download <IPS-COAX Flyer.pdf> for detail information.

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IPS-TRIAX KitStart for High Resolution I-V, C-V, Pulsed I-V Measurements.

IPS-TRIAX is a high resolution probing solution for optimized I-V/C-V measurements. This system incorporates everything

you need for tests and measurements down to fA levels. 

Please download <IPS-TRIAX Flyer.pdf> for detail information.

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IPS-FA KitStart for electrical failure analysis

IPS-FA is a precision probing solution for electrical failure analysis of probing features smaller than 1 micron. It can adapt to the applications for optimized I-V/C-V, PIV and RF tests without making any changes to the probe station. This KitStart saves you time and money for setting up a system for a wide variety of applications.


Please download <IPS-FA Flyer.pdf> for detail information.

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Chuck Stage Option - SimpleStage

SimpleStage has only X-Y coarse positioning and theta rotation. Its smooth and fast X-Y adjustment is driven manually on a ergonomic air bearing stage. This set up is perfect for users with very limited buget but a stable probe station system is needed. It can be upgraded to AccuStage without modifications to other parts.

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Chuck Stage Option - AccuStage

Besides the air bearing stage, AccuStage has fine X-Y-Z and theta adjustment. They are all spring loaded and driven by precise micrometer heads. This set up not only assures positioning accuracy but also reduces system set up time, thus thriving measurement efficiency.

IPS probe station Wafer Probe Station Laser cutting probe station Hot chuck probe station

Microscope Option - Stereoscope

IPS’ stereoscope is a Motic SMZ171 microscope. It has a magnification of 100X with 110mm working distance. This is ideal for basic I-V/CV probing and RF probing. InitialPS-Stereo can be upgraded to superscope Superscope or SlimScope set up without modifications to any other parts, which means the shortest lead time and the best price to meet higher measurement requirements.

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Microscope Option - Superscope

Superscope has a turret for 4 M Plan APO lens. The magnification range could be 20X~2000X with 2X~100X objectives. This system( wafer probe station ) is generally set up for probing on tiny geometric structures of wafer level reliability tests, failure analysis, high power tests, etc. InitialPS’ intuitive manipulation enables users focus more on their measurements rather than probe station manipulation. 


IPS probe station Wafer Probe Station Laser cutting probe station Hot chuck probe station

Microscope Option - SlimScope

SlimScope has a 0.58X~7X Zoom lens. When used with 1X microscope, it has 82mm working distance. It is also compatible with M Plan APO objective lens for higher magnification application. Generally InitialPS with a SlimScope is set up for High-performance RF, multi-contact/mixed signal probing, Single-ended broadband/mmWave, THz, source/load pull andRF noise probing.