EN

Translate:

HAPS probe station Submicron Wafer Probe Station Laser cutting probe station Hot chuck probe station

Features

Application oriented – Kitstart test kits provide know-how test methods and techniques for various applications.


Highly stable and accurate – Built on a granite base with <5 micron planarity, which provides the stability and accuracy crucial to highly reliable test results. 


Slimscope and superscope – Slimscope for tests requires space besides the microscope (mmW test, etc.)and Superscope for high magnification requirements . 


Cost-effective – The most cost effective system among the products of the same grade.

HAPS probe station Submicron Wafer Probe Station Laser cutting probe station Hot chuck probe station

SlimScope Set Up

HAPS with a SlimScope is generally set up for High-performance RF, multi-contact/mixed signal probing, Single-ended broadband/mmWave, THz, source/load pull, RF noise probing. All these measurements requires the probe station to be ultra accurate and stable fo ensure reliable measurement output. SlimScope and Superscope is interchangeable.


HAPS probe station Submicron Wafer Probe Station Laser cutting probe station Hot chuck probe station

Superscope Set Up

HAPS with a Superscope is generally set up for probing on tiny geometric structures of wafer level reliability tests, failure analysis, high power tests, etc. HAPS’ intuitive manipulation enables users focus more on their measurements rather than probe station manipulation. SlimScope and Superscope is interchangeable.